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Tunable Replica Bits for Dynamic Variation Tolerance in 8T SRAM Arrays.

Arijit RaychowdhuryBibiche M. GeuskensKeith A. BowmanJames W. TschanzShih-Lien LuTanay KarnikMuhammad M. KhellahVivek K. De
Published in: IEEE J. Solid State Circuits (2011)
Keyphrases
  • dynamic environments
  • dynamically changing
  • load balancing
  • databases
  • data mining
  • artificial intelligence
  • similarity measure
  • motion estimation
  • peer to peer
  • image quality
  • power consumption
  • computer networks
  • low power