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Yield enhancement flow for analog and full custom designs reliability-rules automatic application.
Ahmad Abdulghany
Rami Fathy Salem
Luigi Capodieci
Shobhit Malik
Published in:
IDT (2011)
Keyphrases
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application specific
databases
association rules
low cost
domain specific
infrared
flow field
database
machine learning
image processing
image sequences
bayesian networks
rough sets
fully automatic
reliability analysis