Conflicting International Standards Pressure Chip Designers.
Victor BermanPublished in: IEEE Des. Test Comput. (2007)
Keyphrases
- international standards
- low cost
- high speed
- high density
- analog vlsi
- physical design
- design tools
- end users
- design process
- conceptual design
- single chip
- learning algorithm
- ibm zenterprise
- solid models
- programmable logic
- vlsi implementation
- information retrieval
- printed circuit boards
- interface design
- computer programs
- vlsi design
- wireless sensor networks
- case study
- metadata
- chip design
- artificial intelligence