A variable-level automated defect identification model based on machine learning.
Yuwei ZhangYing XingYunzhan GongDahai JinHonghui LiFeng LiuPublished in: Soft Comput. (2020)
Keyphrases
- machine learning
- computer vision
- machine learning algorithms
- knowledge representation
- automatic identification
- computational intelligence
- data driven
- semi automated
- knowledge acquisition
- fully automated
- machine learning methods
- learning tasks
- kernel methods
- automated analysis
- active learning
- levels of abstraction
- inductive logic programming
- statistical methods
- semi automatic
- data mining
- higher level
- text classification
- natural language processing
- pattern recognition