BIST Testability Enhancement of System Level Circuits : Experience with An Industrial Design.

Kowen Lai Christos A. Papachristou

Published in: Asian Test Symposium (1996)

Keyphrases

industrial design
higher level
levels of abstraction
machine learning
image processing
lower level
analog circuits
data sets
real world
multiscale
artificial neural networks
user interface
multiresolution
hidden markov models
built in self test