Machine-Learning-Based Read Reference Voltage Estimation for NAND Flash Memory Systems Without Knowledge of Retention Time.
Hyemin ChoeJeongju JeeSeung-Chan LimSung-Min JoeIl-Han ParkHyuncheol ParkPublished in: IEEE Access (2020)
Keyphrases
- flash memory
- machine learning
- learning systems
- embedded systems
- knowledge acquisition
- disk drives
- solid state
- garbage collection
- storage systems
- read write
- hard disk
- database systems
- expert systems
- main memory
- random access
- power system
- data storage
- file system
- knowledge management
- b tree
- storage medium
- data management
- management system
- case study
- decision trees