California scan architecture for high quality and low power testing.
Kyoung Youn ChoSubhasish MitraEdward J. McCluskeyPublished in: ITC (2007)
Keyphrases
- low power
- vlsi architecture
- high quality
- power consumption
- high speed
- low cost
- cmos technology
- single chip
- mixed signal
- nm technology
- vlsi circuits
- high power
- real time
- power dissipation
- low power consumption
- digital signal processing
- power reduction
- signal processor
- gate array
- logic circuits
- wireless transmission
- image sensor
- hardware and software
- parallel processing
- image quality