Login / Signup

Experimental study and analysis of corner compensation structures for CMOS compatible bulk micromachining using 25 wt% TMAH.

Ravindra MukhiyaAlvise BagoliniT. K. BhattacharyyaLeandro LorenzelliM. Zen
Published in: Microelectron. J. (2011)
Keyphrases
  • experimental study
  • experimental evaluation
  • statistical analysis
  • structural analysis
  • genetic algorithm
  • artificial intelligence
  • multiscale
  • data analysis