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High temperature physical modeling and verification of a novel 4H-SiC lateral JFET structure.

Xueqian ZhongLi ZhangGang XieQing GuoTao WangKuang Sheng
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • high temperature
  • model checking
  • real world
  • computer vision
  • xml documents
  • membership functions
  • complex structures
  • structural analysis
  • verification method