Leveraging Independent Double-Gate FinFET Devices for Machine Learning Classification.
Farid KenarangiInna Partin-VaisbandPublished in: ISCAS (2020)
Keyphrases
- pattern classification
- machine learning
- pattern recognition
- feature extraction
- mobile devices
- decision trees
- natural language processing
- information extraction
- data analysis
- machine learning methods
- classification process
- machine learning algorithms
- statistical learning
- supervised classification
- knowledge acquisition
- supervised machine learning
- text classification
- supervised learning
- image classification
- data sets
- classification accuracy
- reinforcement learning
- feature selection
- computer vision
- learning algorithm
- data mining
- knowledge representation
- model selection
- unsupervised learning
- support vector machine svm
- feature space
- inductive logic programming
- automatic classification