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SOC test architecture design for efficient utilization of test bandwidth.

Sandeep Kumar GoelErik Jan Marinissen
Published in: ACM Trans. Design Autom. Electr. Syst. (2003)
Keyphrases
  • cost effective
  • statistical significance
  • real time
  • clustering algorithm
  • image sequences
  • expert systems
  • computationally efficient
  • computationally expensive