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Counterfeit Detection by Semiconductor Process Technology Inspection.

Matthias LudwigAnn-Christin BetteBernhard LippmannGeorg Sigl
Published in: ETS (2023)
Keyphrases
  • case study
  • process model
  • automatic detection
  • personal computer
  • real world
  • decision making
  • image processing
  • website
  • anomaly detection
  • detection algorithm
  • rapid development