Configuration-Specific Test Pattern Extraction for Field Programmable Gate Arrays.
Fabrizio FerrandiFranco FummiLaura PozziMariagiovanna SamiPublished in: DFT (1997)
Keyphrases
- pattern extraction
- field programmable gate array
- hardware software co design
- embedded systems
- post processing
- hardware and software
- hardware implementation
- machine learning
- parallel computing
- hardware architecture
- markov random field
- computer systems
- pattern mining
- pattern discovery
- real world
- massively parallel
- image processing
- computer vision
- fpga technology