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A modeling approach for ΣΔ fractional-N frequency synthesizers allowing straightforward noise analysis.

Michael H. PerrottMitchell D. TrottCharles G. Sodini
Published in: IEEE J. Solid State Circuits (2002)
Keyphrases
  • structural analysis
  • short time fourier transform
  • image restoration
  • noisy data
  • neural network
  • information retrieval
  • image processing
  • data analysis
  • missing data
  • noise level