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Effect of residual stress on the electrical activity of dislocations in GaN light emitting diodes.

Tigran NshanianPat N. GrillotMichael HolubSatoshi WatanabeWerner Götz
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • electrical activity
  • light emitting diodes
  • light emitting
  • real time
  • video camera
  • machine learning
  • image processing
  • multimedia
  • object recognition
  • color images
  • edge detection
  • single image
  • ecg signals