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An assessment of vulnerability of hardware neural networks to dynamic voltage and temperature variations.
Xun Jiao
Mulong Luo
Jeng-Hau Lin
Rajesh K. Gupta
Published in:
ICCAD (2017)
Keyphrases
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neural network
pattern recognition
artificial neural networks
multi layer
room temperature
low cost
dynamic environments
electric field
real time
hardware and software
risk assessment
genetic algorithm
back propagation
power system
neural nets
high temperature