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Modeling of Current Conduction during RESET Phase of Pt/Ta2O5/TaOx/Pt Bipolar Resistive RAM Devices.
Arya Lekshmi Jagath
T. Nandha Kumar
Haider Abbas F. Almurib
Published in:
NVMSA (2018)
Keyphrases
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mobile devices
high density
data mining
design considerations
multiscale
embedded systems
training phase
modeling framework
preprocessing phase