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NBTI in FinFET Circuits under the Temperature Effect Inversion.
Warin Sootkaneung
Pipatphon Lapamonpinyo
Sasithorn Chookaew
Suppachai Howimanporn
Published in:
CSE/EUC/DCABES (2016)
Keyphrases
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high speed
real world
fault diagnosis
computer vision
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image processing
analog circuits
image reconstruction
infrared
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