Using multiple measures to predict confidence in instance classification.
Kristine MonteithTony R. MartinezPublished in: IJCNN (2010)
Keyphrases
- pattern recognition
- automatic classification
- feature selection
- classification systems
- feature extraction
- classification scheme
- feature space
- classification accuracy
- supervised learning
- support vector machine svm
- confidence measure
- image classification
- support vector machine
- decision trees
- support vector
- feature vectors
- classification process
- evaluation measures
- classification models
- pattern classification
- classification method
- cross validation
- benchmark datasets
- data sets
- text classification
- classification algorithm
- cost sensitive
- class labels
- preprocessing
- social networks