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Testability access of the high speed test features in the Alpha 21264 microprocessor.

Dilip K. BhavsarDavid R. AkesonMichael K. GowanDaniel B. Jackson
Published in: ITC (1998)
Keyphrases
  • high speed
  • co occurrence
  • feature extraction
  • feature space
  • feature vectors
  • prior knowledge
  • structural information
  • low power
  • multiscale
  • video sequences
  • low level
  • design methodology