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A generalized model for the lifetime of microelectronic components, applied to storage conditions.

Loren J. WiseRonald D. SchrimpfHarold G. ParksKenneth F. Galloway
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • computational model
  • mathematical model
  • probabilistic model
  • statistical model
  • formal model
  • databases
  • search engine
  • decision making
  • data structure
  • expert systems
  • sensitivity analysis
  • multi layer