Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices.
Fu-Liang YangJiunn-Ren HwangYiming LiPublished in: CICC (2006)
Keyphrases
- low voltage
- cmos technology
- silicon on insulator
- low power
- mobile devices
- low cost
- metal oxide semiconductor
- power consumption
- mobile applications
- nm technology
- high speed
- embedded devices
- power supply
- circuit design
- intelligent environments
- data sets
- power grid
- low power consumption
- analog vlsi
- transmission electron microscopy
- cmos image sensor
- electro mechanical