Patent overlay mapping: Visualizing technological distance.

Luciano Kay Nils C. Newman Jan L. Youtie Alan L. Porter Ismael Ràfols

Published in: J. Assoc. Inf. Sci. Technol. (2014)

Keyphrases

information retrieval
distance measure
distance function
intellectual property
ontology mapping
prior art
patent retrieval
machine learning
learning algorithm
data analysis
relational databases
user interface
distance transform
dissimilarity measure
patent documents
patent search