Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips.

Piotr Zajac Jacques Henri Collet Andrzej Napieralski

Published in: IOLTS (2008)

Keyphrases

massively parallel
evaluation metrics
high speed
integrated circuit
state space
parallel computing
high end
artificial intelligence
computer systems
real time
neural network
feature selection
multiscale
quality measures
high density
similarity metrics