Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification.
Chia-Yu HsuJu-Chien ChienPublished in: J. Intell. Manuf. (2022)
Keyphrases
- pattern classification
- weighted majority
- convolutional neural networks
- majority vote
- classifier ensemble
- base learners
- pattern recognition
- feature extraction
- maximum a posteriori
- learning algorithm
- ensemble methods
- classifier combination
- base classifiers
- neural network
- ensemble classifier
- training set
- multiple classifier systems
- decision trees
- model selection
- classification accuracy
- random forest
- ensemble learning
- regression problems
- pairwise
- training data
- data mining
- feature selection