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Failure modes and effects analysis for high-power GaN-based light-emitting diodes package technology.

Ray-Hua HorngRe-Ching LinYi-Chen ChiangBing-Han ChuangHung-Lieh HuChen-Peng Hsu
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • failure modes and effects
  • real time
  • high power
  • neural network
  • video sequences
  • low cost
  • computer simulation
  • fuzzy logic
  • digital images
  • cost effective
  • light emitting diodes