Increasing Imaging Speed and Accuracy in Contact Mode AFM.
Andrius DzedzickisVytautas BucinskasTadas LenkutisInga Morkvenaite-VilkoncieneViktor KovalevskyiPublished in: AUTOMATION (2019)
Keyphrases
- atomic force microscopy
- processing speed
- execution speed
- image processing
- high accuracy
- prediction accuracy
- real time
- computational cost
- image analysis
- high resolution
- high speed
- computer vision
- image segmentation
- classification accuracy
- case study
- error rate
- feature selection
- precision and recall
- imaging systems
- improved accuracy
- acquired images
- training speed
- search engine
- data sets