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Multiple Granularities Generative Adversarial Network for Recognition of Wafer Map Defects.
Jianbo Yu
Jiatong Liu
Published in:
IEEE Trans. Ind. Informatics (2022)
Keyphrases
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multiple granularities
recognition accuracy
network structure
recognition rate
object recognition
generative model
feature extraction
high dimensional
spatio temporal
decision making
data analysis
relational databases
wireless sensor networks
markov random field
maximum a posteriori
semiconductor manufacturing