A Process and Technology-Tolerant IDDQ Method for IC Diagnosis.
Chintan PatelJim PlusquellicPublished in: VTS (2001)
Keyphrases
- synthetic data
- computational complexity
- detection method
- data mining
- preprocessing
- pairwise
- machine learning
- optimization process
- cost function
- knn
- high accuracy
- recognition process
- classification process
- high precision
- classification method
- dynamic programming
- evolutionary algorithm
- multiscale
- similarity measure
- case study