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Gate-controlled field-effect diodes and silicon-controlled rectifier for charged-device model ESD protection in advanced SOI technology.

Shuqing CaoJung-Hoon ChunAkram A. SalmanStephen G. BeebeRobert W. Dutton
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • computational model
  • management system
  • neural network
  • information systems
  • similarity measure
  • probabilistic model
  • probability distribution
  • experimental data
  • high density
  • metal oxide semiconductor