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Testable Realizations of CMOS Combinatorial Circuits for Voltage and Current Testing.

K. BiswasS. Rai
Published in: VLSI Design (1994)
Keyphrases
  • low voltage
  • cmos technology
  • high speed
  • circuit design
  • analog vlsi
  • power supply
  • vlsi circuits
  • low power
  • design considerations
  • delay insensitive
  • random access memory
  • data sets
  • low cost
  • test cases
  • power management