Special issue on "Applications of graph-based techniques to pattern recognition".
Pasquale FoggiaMario VentoCheng-Lin LiuPublished in: Pattern Recognit. Lett. (2020)
Keyphrases
- special issue
- pattern recognition
- international journal
- applied intelligence
- neural network
- ai edam
- signal processing
- ecml pkdd
- pattern recognition problems
- computer vision
- machine learning
- special section
- image processing
- semi supervised
- image analysis
- dimensionality reduction
- rough sets
- graph model
- graph theoretic
- supply chain
- pattern classification
- future directions