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2D Device Simulation of AlGaN/GaN HFET Current Collapse Caused by Surface Negative Charge Injection.
Yusuke Ikawa
Yorihide Yuasa
Cheng-Yu Hu
Jin-Ping Ao
Yasuo Ohno
Published in:
IEICE Trans. Electron. (2010)
Keyphrases
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positive and negative
computer vision
d objects
mathematical analysis
data sets
three dimensional
object recognition
low cost
mathematical model
vector field
simulation study
simulation environment
surface points