Random Pattern Testability of Memory Control Logic.
Jacob SavirPublished in: IEEE Trans. Computers (1998)
Keyphrases
- pattern matching
- control problems
- control system
- knowledge base
- modal logic
- control method
- logic programming
- data acquisition
- control strategy
- pattern discovery
- optimal control
- memory usage
- computational properties
- associative memory
- memory size
- asynchronous circuits
- random access memory
- classical logic
- computing power
- real time
- data sets