Diatom Autofocusing in Brightfield Microscopy: a Comparative Study.
José Luis Pech-PachecoGabriel CristóbalJesús Chamorro-MartínezJoaquín Fernández-ValdiviaPublished in: ICPR (2000)
Keyphrases
- image analysis
- microscopy images
- high throughput
- comparative study
- neural network
- depth from focus
- image stacks
- image enhancement
- high resolution
- long term
- machine learning
- fluorescence microscopy
- confocal images
- data mining
- data sets
- viewpoint
- data analysis
- high speed
- pattern recognition
- three dimensional
- computer vision