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Prelayout interconnect yield prediction.

Phillip ChristieJosé Pineda de Gyvez
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2003)
Keyphrases
  • prediction accuracy
  • prediction model
  • real world
  • data structure
  • high speed
  • prediction algorithm
  • data sets
  • information retrieval
  • computer vision
  • multiscale
  • special case
  • predictive model