An Improved Sine Wave Histogram Test Method for ADC Characterization.
Vilmos PálfiPublished in: IEEE Trans. Instrum. Meas. (2019)
Keyphrases
- test data
- high accuracy
- computational cost
- high precision
- objective function
- pairwise
- detection method
- statistical significance
- preprocessing
- significant improvement
- synthetic data
- mathematical model
- classification accuracy
- mutual information
- classification method
- frequency domain
- histogram matching
- data sets
- detection algorithm
- feature set
- probabilistic model
- dynamic programming
- cost function
- similarity measure
- feature selection
- neural network