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Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing.
Lung-Jen Lee
Wang-Dauh Tseng
Rung-Bin Lin
Chi-Wei Yu
Published in:
Asian Test Symposium (2009)
Keyphrases
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low power
power consumption
high speed
low cost
single chip
logic circuits
high power
digital signal processing
wireless transmission
error correction
motion estimation
general purpose
signal to noise ratio
signal processor