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A New Inter-Core Built-In-Self-Test Circuits for Tri-State Buffers in the System on a Chip.

Tetsuji KishiMitsuyasu OhtaTakashi TaniguchiHiroshi Kadota
Published in: Asian Test Symposium (2001)
Keyphrases
  • built in self test
  • high speed
  • analog vlsi
  • integrated circuit
  • circuit design
  • low cost
  • neural network
  • database systems
  • artificial neural networks
  • finite state machines