Can You See What Others See -A Defect Detection Model for Patterned Backgrounds.
Guo-Feng WeiM. Ronnier LuoPeter A. RhodesPublished in: CGIV (2012)
Keyphrases
- mathematical model
- defect detection
- computational model
- computer vision
- high level
- statistical model
- expectation maximization
- hybrid model
- network model
- prediction model
- formal model
- bayesian framework
- neural network model
- database
- management system
- probability distribution
- data structure
- image segmentation
- e learning
- information systems
- machine learning
- neural network