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Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction.
Shubham Kumar
Swetaki Chatterjee
Simon Thomann
Yogesh Singh Chauhan
Hussam Amrouch
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2023)
Keyphrases
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computational complexity
neural network
wireless sensor networks
wireless networks
routing algorithm