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Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction.

Shubham KumarSwetaki ChatterjeeSimon ThomannYogesh Singh ChauhanHussam Amrouch
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2023)
Keyphrases
  • computational complexity
  • neural network
  • wireless sensor networks
  • wireless networks
  • routing algorithm