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Randomized Polynomial Time Identity Testing for Noncommutative Circuits.
Vikraman Arvind
Partha Mukhopadhyay
Raja S
Published in:
Electron. Colloquium Comput. Complex. (2016)
Keyphrases
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special case
high speed
computational complexity
software engineering
approximation algorithms
information systems
tunnel diode
database
learning algorithm
search algorithm
worst case