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First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics.

Carlo CazzanigaMarta BagatinSimone GerardinAlessandra CostantinoChristopher D. Frost
Published in: IEEE Trans. Emerg. Top. Comput. (2021)
Keyphrases
  • levels of abstraction
  • object level
  • data sets
  • information retrieval
  • image sequences
  • artificial neural networks
  • trade off
  • user interface
  • higher level