Overcoming Negative nFET VTH by Defect-Compensated Low-Thermal Budget ITO-IGZO Hetero-Oxide Channel to Achieve Record Mobility and Enhancement-mode Operation.
Sonu HoodaChun-Kuei ChenManohar LalShih-Hao TsaiEvgeny ZamburgAaron Voon-Yew TheanPublished in: VLSI Technology and Circuits (2023)