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Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs.
Krishna Pradeep
Theano A. Karatsori
Thierry Poiroux
Andre Juge
Patrick Scheer
Gilles Gouget
Emmanuel Josse
Gérard Ghibaudo
Published in:
ESSDERC (2018)
Keyphrases
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real time
data analysis
statistical analysis
data sets
artificial intelligence
database
neural network
social networks
information systems
image segmentation
similarity measure
control system
higher level
quantitative analysis
levels of abstraction
future development