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VAR-TX: A variability-aware SRAM model for predicting the optimum architecture to achieve minimum access-time for yield enhancement in nano-scaled CMOS.
Jeren Samandari-Rad
Matthew R. Guthaus
Richard Hughey
Published in:
ISQED (2012)
Keyphrases
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formal model
management system
computational model
probabilistic model
low cost
mathematical model
neural network model
bayesian networks
video sequences
prior knowledge
cost function
probability distribution
statistical model
experimental data