C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
An In-depth and Black-box Characterization of the Effects of Clock Glitches on 8-bit MCUs.
Josep Balasch
Benedikt Gierlichs
Ingrid Verbauwhede
Published in:
FDTC (2011)
Keyphrases
</>
black box
black boxes
white box
integration testing
white box testing
state transition
high speed
artificial intelligence
databases
test cases
depth map
rule extraction
power consumption
high level
hybrid systems
case study
fpga device
data sets