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An Application of the Chains-of-Rare-Events Model to Software Development Failure Prediction.
Néstor R. Barraza
Jonás D. Pfefferman
Bruno Cernuschi-Frías
Félix Cernuschi
Published in:
Ada-Europe (2000)
Keyphrases
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software development
probabilistic model
failure prediction
neural network
data warehouse
test data