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An Application of the Chains-of-Rare-Events Model to Software Development Failure Prediction.

Néstor R. BarrazaJonás D. PfeffermanBruno Cernuschi-FríasFélix Cernuschi
Published in: Ada-Europe (2000)
Keyphrases
  • software development
  • probabilistic model
  • failure prediction
  • neural network
  • data warehouse
  • test data