Early estimation of defect density using an in-process Haskell metrics model.
Mark SherriffNachiappan NagappanLaurie A. WilliamsMladen A. VoukPublished in: ACM SIGSOFT Softw. Eng. Notes (2005)
Keyphrases
- management system
- probabilistic model
- density distribution
- statistical model
- computational model
- conceptual model
- process model
- genetic algorithm
- parametric models
- metamodel
- formal model
- theoretical framework
- prior knowledge
- parameter estimation
- theoretical analysis
- source code
- probability distribution
- mathematical model
- cost function
- data model
- web services
- decision making
- diffusion process
- data sets