Towards the Classification of Error-Related Potentials using Riemannian Geometry.
Yichen TangJerry J. ZhangPaul M. CorballisLuke E. HallumPublished in: EMBC (2021)
Keyphrases
- machine learning
- classification scheme
- text classification
- classification accuracy
- feature extraction
- pattern classification
- support vector machine svm
- feature selection
- higher order
- decision trees
- support vector
- classification algorithm
- training set
- pattern recognition
- three dimensional
- support vector machine
- supervised learning
- automatic classification
- feature space
- classification models
- error rate
- cross validation
- shape analysis
- data sets
- generalization error
- manifold learning
- shape model
- classification method
- class labels
- preprocessing
- model selection
- image classification
- semi supervised